Nanomagnetic ImagingNIST researchers have developed a modified form of scanning electron microscopy that can reveal the magnetic characteristics of such a surface without disturbing the magnetization.
Simultaneous Correlative Scanning Electron and High-NA Fluorescence MicroscopyThe article describes an integrated scanning electron microscope and high numerical aperture epi-fluorescence microscope where the electron and optical axes aligned parallel to each other. This allows simultaneous imaging of the samples.
Electron microscope (FESEM)Includes technical introduction to scanning and transmission electron microscopy with emphasise on FESEM and image gallery.
Learning Resources from FEILearn about the basics and capabilities of electron microscopy.
Electron MicroscopyThe goal of this site is to explain the basics of most electron microscopy methods without giving too much of the complex theory and mathematics behind it. Thus, reading these pages can in no way substitute the study of textbooks.
Scanning Electron Microscopy (SEM)
SEM: Scanning Electron Microscope A to Z – Basic Knowledge for Using the SEMAn Ebook that includes the basic principals of operation, image display, the role of secondary and backscattered electron detectors, and the vacuum system. Further explanation of the SEM includes edge effect, the influence of accelerating voltage, the illumination effect of secondary and backscatter electron detectors, techniques for improving image resolution, benefits of different types of electron guns, elemental analysis, and sample preparation.
SEM Q&AA compilation of frequently asked questions received by the JEOL staff during demonstrations and training. Such as: how to mount powder samples, selecting the accelerating voltage, stereoscopic observation techniques, and more.
Focused Ion Beam Systems and Dualbeam SystemsA section on focussed ion beam instruments is included in the FEI booklet "An Introduction to Electron Microscopy". The booklet is an excellent overview of of electron microscopy and nanotechnology for students and teachers. It is available as a pdf for download.
The principal questions about electron microscopy are answered hereThe developers of corrected electron optics, CEOS, have included a basics section that succinctly presents the basics of electron microscopy and aberration correction.
Does Your SEM Really Tell the Truth? - How would you know? Part 1Understanding how image aquisition and instrument calibration is essential when making measurements using a high resolution scanning electron microscope. As the resolution of scanning electron microscope has increased it is essential to understand the factors that can contribute to potenial measurement errors. This well written article is highly recomended for those using SEM imaging for quantification of specimen features. Part 1 is avaialble for free download fron the NIST. Part 2 covering specimen contamination and methods of contamination elimination and part 3 covering contamination are only available for purchase.
From: Three-Dimensional Nanometer Metrology, NIST Physical Measurement Laboratory (PML)
Three-Dimensional Nanometer Metrology, NIST Physical Measurement Laboratory (PML)
Authors: Michael T. Postek; Andras Vladar;
Citation: SCANNING VOL. 35, 355–361 (2013)
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Optimizing the Performance of a Tungsten HairpinTo get the most out of a scanning electron microscope operators need to optimize the accelerating voltage, rightness of the electron gun, the working distance, and signal mix. This will produce the far more information and lead to a better understanding of samples.
Authors: S.K. Chapman
Citation: Scanning Microscopy Vol. 13, No. 1, 199
ESEM Development and its FutureDr. Danilatos pioneered the development of the Environmental scanning Electron Microscope (ESEM) starting 1978. The site includes an overview of the technology and the history of it's development. Included are a listing of patents and publications. Dr.
The Early History and Development of The Scanning Electron Microscope
Investigations & Applications
Low Temperature Scanning Electron Microscopy of Snow CrystalsSamples of snow are studied by scanning electron microscopy to determine grain size and morphology at the Beltsville of the U.S. Department of Agriculture. Grain size and morphology are factors in estimating the water content of winter packed snow. Correlation with remote sensing is used for predication of flooding and estimating water supply. Images are in the public domain and available for use with proper citation.
Authors: Gary Bauchan and Charlie Murphy
Electron Microscopy of Foods and Microorganismsfacinating site on the scanning electron microscopy of foods and food born bacteria. Images and articles from several microscopist are included.
Scientific Working Group for Gunshot ResidueScientific Working Group for Gunshot Residue makes recommendations for the forensic examination of gunshot residue. It is composed of 27 international experts. The pdf Primer Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive is a comprehensive guide that represents the mutually agreed upon opinions of the expert group. The site also includes a gallery of scanning electron microscope images, the results of contamination studies, and links to ASMT procedures.
Microscopy and HygieneThis easy to read article in pdf format presents examples of the uses electron microscopy to characterize bacteria and fungi in our digestive tract, on our skin, on money, and in food. There are many false colored images.
Scanning Electron Microscope (SEM) Images of Building MaterialsHigh quality scanning electron microscope images of building and construction materials and fabric are used to discuss the relationship of microscopic characteristics of porosity and the interconnection of pores to the flow of energy and water though the material.
Authors: Robert Bean, R.E.T., P.L.(Eng.)
Citation: Healthy Heating, www.healthyheating.com
Introductions and Briefs
How Scanning Electron Microscopes Work
Scanning Electron Microscope BasicsA detailed interactive animation that illustrate the basics of imaging in the Scanning Electron Microscope (SEM).
Neuroscience’s Block PartyThis is an easy to read overview of Serial block-face electron microscopy (SBEM). SBEM is where a utralmicrotome holding and embedded sample stained with metal ions is placed in the chamber of scanning electron microscope is providing high resolution images of cellular and subcellular organizaition.
Authors: Amy R. Volpert