Quote /About Microscopy and From Microscopists

David C. Joy

"Scanning electron microscopy: Second best no more."

This comment was made in Nature Materials following an article by Y. Zhu, H. Inada, K. Nakamura, J. Wall titled <em>Imaging single atoms using secondary electrons with an aberration-corrected electron microscope</em>. Secondary electron imaging in scanning electron microscopes is able to compete with the resolution of scanning transmission electron microscopes.

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Imaging single atoms using secondary electrons with an aberration-corrected electron microscope

Article reports on a new scanning electron microscope that with aberration correction, able to image single atoms by detecting electrons emerging from its surface using the interaction with the small probe. Abstract is online and article can be rented for a nominal fee.

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