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Electron Microscopes

Real-time 3D Analytical FIB-SEM NX9000; Orthagonally-arranged FIB-SEM

FIB-SEM Composite Instrument from Hitachi at M & M 2015

View News 7/30/2015

Hitachi High-Technologies Corporation will introduce its new instrument, the NX9000, at Microscopy & Microanalysis 2015 in Portland, U.S.A. from August 2-6, 2015. The NX9000 is the second product created through the collaboration of Hitachi High-Tech and its subsidiary Hitachi High-Tech Science Corporation. This real-time 3D analytical FIB*1-SEM*2 composite instrument boasts improved 3D structural analysis precision and throughput, and can be used in applications of SEM observation, 3D EBSD, 3D EDS, TEM or atom probe sample preparation, and more. By arranging the SEM column and FIB column orthogonally, instead of diagonally, the NX9000 is optimized for improved throughput and precision in 3D structural analysis applications.