News: Release

Bruker Introduces Unique Software Package for Dynamical EBSD Pattern Simulation

Published: August 04, 2014

At the Microscopy and Microanalysis (M&M) 2014 Annual Meeting, Bruker today introduces ESPRIT DynamicS, a highly sophisticated and powerful software tool for most realistic, high resolution simulation of electron backscatter diffraction (EBSD) patterns.

EBSD relies on the analysis of Kikuchi electron diffraction patterns which are obtained from microscopic regions of a sample in a scanning electron microscope. While the simulation of Kikuchi patterns is a common means to support accurate analysis of crystal orientations and crystallographic phases, the kinematic simulation models used in solutions available to date entail severe limitations with regard to the level of detail, and therefore the analytical value, they can provide to the user.

ESPRIT DynamicS is the first commercially available software to calculate Kikuchi patterns utilizing the dynamical theory of electron diffraction. The dynamical theory of electron diffraction takes all physical effects and parameters of the pattern generation into account, such as the values of the lattice parameters, the electron beam energy, the symmetry and chemical composition of the crystal structure, etc. Based on a revolutionary software engine the program makes full use of available computing power to provide high resolution simulations with a wealth of detail within incredible short times.

As a result, ESPRIT DynamicS enables all users of EBSD systems, irrespective of the brand, to easily simulate most realistic Kikuchi patterns as a matter of routine. The program not only supports exact crystal orientation analysis and accurate phase identification, but is also a very useful tool to optimize system calibration and to simulate details that are unobtainable with other approaches, such as higher order Laue zones (HOLZ) rings or patterns of non-centrosymmetric crystals.

ESPRIT DynamicS supports the import of crystallographic phase definitions in various formats, e.g. ESPRIT XML phase list files, crystallographic information files (CIF), or PowderCell files (CEL). Arbitrary EBSD patterns can be imported in common graphics formats. Simulation results are stored in form of a master file describing the complete diffraction data for a specific phase, facilitating the subsequent real-time projection and rotation of the simulated data.

Bruker Nano Analytics

Bruker Nano Analytics

Bruker Nano Analytics (BNA), headquartered at Bruker Nano GmbH in Berlin, Germany, develops, manufactures and markets X-ray systems and components for elemental and structural analysis on the micro and nano scale. BNA's product range of analytical tools for electron microscopes includes: Energy-dispersive X-ray spectrometers (EDS) for scanning and transmission electron microscopes, Wavelength-dispersive X-ray spectrometers (WDS), Electron backscatter diffraction systems (EBSD), Micro-spot X-ray sources for Micro-XRF on SEM and Micro computed tomography (Micro-CT) accessories. BNA’s range of mobile and bench-top micro X-ray fluorescence spectrometers comprises Micro-XRF spectrometers and Total reflection X-ray fluorescence (TXRF) spectrometers.

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