Buyers Guide: X-Ray Fluorescence in a Scanning Electron Microscope -SEM

QUANTAX Micro-XRF in a SEM

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The Quantax micro-XRF adds micro-spot XRF capabilities to a scanning electron microscope without interference with normal SEM operation. With XRF there is better trace element sensitivity and increased depth of analysis. Micro-XRF and EDS analysis can be done without position change and both methods are integrated in the ESPIT 2.0 analytical software suite. XTrace fits on a free inclined chamber port of almost any SEM.