SEM, TEM and STEM Magnification CalibrationWeb Link
Magnification calibration standards for transmission electron and scanning electron microscopy include nanosphere and microsphere particle standards, grating replicas, catalase crystals with lattice planes of 8.75nm and 6.85nm, and MAG*I*CAL™ cross milled specimen of a series of atomically flat layers of Si and SiGe calibrated to the <111> spacing of silicon.
Astigmatism CorrectionWeb Link
Holey carbon fim and evaporate Pt Ir specimens are available for focus and astigmatism correction.
EM ResolutionWeb Link
The medium to ultra high scanning electron microscope (SEM) resolution test specimens use the resolved gaps and number of gray levels in the image as criteria.
Backscattered Electron ReferenceWeb Link
Backscattered electron reference samples are available as pairs of ultrapure metals with atomic differences of 1 and as copper zinc alloy with two phases differing in atomic number of 0.1 for a more sensitive standard.
Energy Dispersive X-ray PeaksWeb Link
The X-Checker contains manganese to measure full width at half max detector resolution, copper and aluminum to perform spectral calibration, and carbon for low energy x-rays. Boron nitride and fluorine are available.