Buyers Guide: 3-D Electron Beam

3D SEM for Surface Metrology

Electron Microscopy Sciences Web Link

The MeX software package turns any scanning electron microscope with digital imaging into a true surface metrology device using 3D reconstruction algorithms. Using stereoscopic images, the software automatically retrieves 3D information ad creates a 3D dataset that is used to perform traceable metrology examination.

Micro-CT for2D and 3D X-ray Imaging in a SEM

Bruker Nano Analytics Web Link

Bruker’s Micro-CT for SEM can add 2D and 3D high-resolution X-ray imaging capabilities to third-party SEMs, allowing the nondestructive analysis of internal microstructures of specimens.