Buyers Guide: Featured Product

QUANTAX with XFlash® 6T

Excellence in X-ray Analysis for the Transmission Electron Microscope

Two available detectors with 30 mm2 and 60 mm2 area offer ideal solutions for microanalysis and nano-analysis on TEM.

Excellent energy resolution for  reliable analytical results

  • 126 eV premium
  • 129 eV standard

Ultra high throughput for highest measurement speed

  • New signal processing unit with hybrid technology
  • Various shaping times available
  • Over 1,500 kcps input count rate
  • Up to 600 kcps output count rate

Slim-line detector technology for even more counts and lower beam currents

Bruker Nano Analytics

Bruker Nano Analytics (BNA), headquartered at Bruker Nano GmbH in Berlin, Germany, develops, manufactures and markets X-ray systems and components for elemental and structural analysis on the micro and nano scale. BNA's product range of analytical tools for electron microscopes includes: Energy-dispersive X-ray spectrometers (EDS) for scanning and transmission electron microscopes, Wavelength-dispersive X-ray spectrometers (WDS), Electron backscatter diffraction systems (EBSD), Micro-spot X-ray sources for Micro-XRF on SEM and Micro computed tomography (Micro-CT) accessories. BNA’s range of mobile and bench-top micro X-ray fluorescence spectrometers comprises Micro-XRF spectrometers and Total reflection X-ray fluorescence (TXRF) spectrometers.

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