QUANTAX with XFlash® 6T
Two available detectors with 30 mm2 and 60 mm2 area offer ideal solutions for microanalysis and nano-analysis on TEM.
Excellent energy resolution for reliable analytical results
- 126 eV premium
- 129 eV standard
Ultra high throughput for highest measurement speed
- New signal processing unit with hybrid technology
- Various shaping times available
- Over 1,500 kcps input count rate
- Up to 600 kcps output count rate
Slim-line detector technology for even more counts and lower beam currents
For details on products, please visit: QUANTAX with XFlash® 6T
Bruker Nano Analytics
Bruker Nano Analytics (BNA), headquartered at Bruker Nano GmbH in Berlin, Germany, develops, manufactures and markets X-ray systems and components for elemental and structural analysis on the micro and nano scale. BNA's product range of analytical tools for electron microscopes includes: Energy-dispersive X-ray spectrometers (EDS) for scanning and transmission electron microscopes, Wavelength-dispersive X-ray spectrometers (WDS), Electron backscatter diffraction systems (EBSD), Micro-spot X-ray sources for Micro-XRF on SEM and Micro computed tomography (Micro-CT) accessories. BNA’s range of mobile and bench-top micro X-ray fluorescence spectrometers comprises Micro-XRF spectrometers and Total reflection X-ray fluorescence (TXRF) spectrometers.