Buyers Guide: Featured Product

QUANTAX EDS for SEM
EDS with Slim-line Technology

QUANTAX EDS features the XFlash® 6 detector series with active areas from 10 mm2 to 100 mm2.

Generation 6 provides the hardware and software technology to deliver the fastest and most reliable results:

  • The new  slim-line technology detectors, large area SDDs, and high performance pulse processing produce the count rates to speed up any analytical task
  • Motorized detector movement, light weight design and choice of materials make detector handling easier and warrant minimum interference with microscope performance
  • The best energy resolution provides the highest quality spectra
  • The world’s most comprehensive atomic database ensures dependable peak identification, especially in the crowded low energy range
  • Most sophisticated algorithms for quantification and the unique combination of standardless and standard-based methods provide highest accuracy results.

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Bruker Nano Analytics

Bruker Nano Analytics (BNA), headquartered at Bruker Nano GmbH in Berlin, Germany, develops, manufactures and markets X-ray systems and components for elemental and structural analysis on the micro and nano scale. BNA's product range of analytical tools for electron microscopes includes: Energy-dispersive X-ray spectrometers (EDS) for scanning and transmission electron microscopes, Wavelength-dispersive X-ray spectrometers (WDS), Electron backscatter diffraction systems (EBSD), Micro-spot X-ray sources for Micro-XRF on SEM and Micro computed tomography (Micro-CT) accessories. BNA’s range of mobile and bench-top micro X-ray fluorescence spectrometers comprises Micro-XRF spectrometers and Total reflection X-ray fluorescence (TXRF) spectrometers.

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